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Submissions from 2013

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Cost Optimized Reliability Test Planning and Decision Making Through Bayesian Methods, C H. Recchia

Submissions from 2010

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Explaining Cache SER Anomaly Using Relative DUE AVF Measurement, Arijit Biswas, Charles H. Recchia, Shubhendu S. Mukherjee, Vinod Ambrose, Leo Chan, Aamer Jaleel, Mike Plaster, and Norbert Seifert

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On the Radiation-Induced Soft Error Performance of Hardened Sequential Elements in Advanced Bulk CMOS Technologies, Norbert Seifert, Vinod Ambrose, B Gill, Q Shi, R Allmon, Charles H. Recchia, S Mukherjee, N Nassif, J Krause, J Pickholtz, and A Balasubramanian

Submissions from 2003

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Photoimageable Material Patterning Techinques Useful in Fabricating Conductive Lines in Circuit Structures, P Moon, M Hussein, A Myers, C Recchia, S Sivakumar, and A Kandas

Submissions from 2002

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Pattern-Sensitive Deposition for Damascene Processing, M Hussein, A Myers, Charles H. Recchia, S Sivakumar, and A Kandas

Submissions from 1997

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NMR and Vortex Lattice Melting in YBa2Cu3O7, Charles H. Recchia, J A. Martindale, C H. Pennington, W L. Hults, and J L. Smith

Submissions from 1996

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Gaussian Phase Approximation for Evaluating the Decay of NMR Spin Echoes, Charles H. Recchia, K R. Gorny, and C H. Pennington

Submissions from 1995

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Vortex Dynamics in Single Crystal YBa2Cu3O7 Probed by 63Cu Nuclear Spin Echo Measurements in the Presence of Transport Current Pulses, Charles H. Recchia, C H. Pennington, H Haughlin, and G P. Lafyatis

Submissions from 1988

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Microcomputer in an Introductory College Astronomy Laboratory: A Software Development Project, D D. Meisel, K F. Kinsey, and Charles H. Recchia