Submissions from 2013


Cost Optimized Reliability Test Planning and Decision Making Through Bayesian Methods, C H. Recchia

Submissions from 2010


Explaining Cache SER Anomaly Using Relative DUE AVF Measurement, Arijit Biswas, Charles H. Recchia, Shubhendu S. Mukherjee, Vinod Ambrose, Leo Chan, Aamer Jaleel, Mike Plaster, and Norbert Seifert


On the Radiation-Induced Soft Error Performance of Hardened Sequential Elements in Advanced Bulk CMOS Technologies, Norbert Seifert, Vinod Ambrose, B Gill, Q Shi, R Allmon, Charles H. Recchia, S Mukherjee, N Nassif, J Krause, J Pickholtz, and A Balasubramanian

Submissions from 2003


Photoimageable Material Patterning Techinques Useful in Fabricating Conductive Lines in Circuit Structures, P Moon, M Hussein, A Myers, C Recchia, S Sivakumar, and A Kandas

Submissions from 2002


Pattern-Sensitive Deposition for Damascene Processing, M Hussein, A Myers, Charles H. Recchia, S Sivakumar, and A Kandas

Submissions from 1997


NMR and Vortex Lattice Melting in YBa2Cu3O7, Charles H. Recchia, J A. Martindale, C H. Pennington, W L. Hults, and J L. Smith

Submissions from 1996


Gaussian Phase Approximation for Evaluating the Decay of NMR Spin Echoes, Charles H. Recchia, K R. Gorny, and C H. Pennington

Submissions from 1995


Vortex Dynamics in Single Crystal YBa2Cu3O7 Probed by 63Cu Nuclear Spin Echo Measurements in the Presence of Transport Current Pulses, Charles H. Recchia, C H. Pennington, H Haughlin, and G P. Lafyatis

Submissions from 1988


Microcomputer in an Introductory College Astronomy Laboratory: A Software Development Project, D D. Meisel, K F. Kinsey, and Charles H. Recchia