Lateral force microscopy is the primary means for the study of nanotribology: a rapidly growing field of research. A new method for lateral force calibration was derived and investigated. The technique utilizes mathematics of mean values and directionality, greatly simplifying the process of LFM calibration. Experimental analysis produced convincing data proving the validity of the concept. This in-situ method offers potential advantages over current methods, such as reduced tip wear, limited reliance on unproven assumptions, and ease of use.

• This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

Creator

• Eggiman, Derek Jon

Publisher

• Worcester Polytechnic Institute

Identifier

• E-project-030808-090213

Advisor

• Burnham, Nancy A.

Year

• 2008

Date created

• 2008-03-08

Resource type

• Major Qualifying Project

Major

• Physics

Rights statement

• In Copyright