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Surface Independent Friction Force Calibration

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Lateral Force Microscopy(LFM) is a powerful technique for imaging nanoscale structures. Reliable quantitative data regarding the magnitude of the nanoscale friction force has been difficult to obtain. Existing calibration methods also suffer from flaws which restrict their usefulness, such as causing excessive tip wear. A new method was derived and tested extensively.

  • This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.
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  • E-project-042810-201705
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  • 2010
Date created
  • 2010-04-28
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