Sub-Picosecond Jitter Clock Generation for Time Interleaved Analog to Digital Converter
Nowadays, Multi-GHz analog-to-digital converters (ADCs) are becoming more and more popular in radar systems, software-defined radio (SDR) and wideband communications, because they can realize much higher operation speed through using many interleaved sub-ADCs to relax ADC sampling rates. Although the time interleaved ADC has some issues such as gain mismatch, offset mismatch and timing skew between each ADC channel, these deterministic errors can be solved by previous works such as digital calibration technique. However, time-interleaved ADCs require a precise sample clock to achieve an acceptable effective-numberof-bits (ENOB) which can be degraded by jitter in the sample clock. The clock generation circuits presented in this work achieves sub-picosecond jitter performance in 180nm CMOS which is suitable for time-interleaved ADC. Two different test chips were fabricated in 180nm CMOS to investigate the low jitter design technique. The low jitter delay line in two chips were designed in two different ways, but both of them utilized the low jitter design technique. In first test chip, the measured RMS jitter is 0.1061ps for each delay stage. The second chip uses the proposed low jitter Delay-Locked Loop can work from 80MHz to 120MHz, which means it can provide the time interleaved ADC with 2.4GHz to 3.6GHz low jitter sample clock, the measured delay stage jitter performance in second test chip is 0.1085ps.