This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.
Worcester Polytechnic Institute
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Anderson, Evan V., "Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis" (2012). Masters Theses (All Theses, All Years). 337.
force curves, calibration, analysis, curve fitting, friction, lateral force microscopy, atomic force microscopy