Faculty Advisor

Burnham, Nancy A.

Abstract

Lateral force microscopy is the primary means for the study of nanotribology: a rapidly growing field of research. A new method for lateral force calibration was derived and investigated. The technique utilizes mathematics of mean values and directionality, greatly simplifying the process of LFM calibration. Experimental analysis produced convincing data proving the validity of the concept. This in-situ method offers potential advantages over current methods, such as reduced tip wear, limited reliance on unproven assumptions, and ease of use.

Publisher

Worcester Polytechnic Institute

Date Accepted

March 2008

Major

Physics

Project Type

Major Qualifying Project

Accessibility

Unrestricted

Advisor Department

Physics

Share

COinS