Faculty Advisor

Burnham, Nancy A.

Abstract

Lateral Force Microscopy(LFM) is a powerful technique for imaging nanoscale structures. Reliable quantitative data regarding the magnitude of the nanoscale friction force has been difficult to obtain. Existing calibration methods also suffer from flaws which restrict their usefulness, such as causing excessive tip wear. A new method was derived and tested extensively.

Publisher

Worcester Polytechnic Institute

Date Accepted

April 2010

Major

Physics

Project Type

Major Qualifying Project

Accessibility

Unrestricted

Advisor Department

Physics

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