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Semiconductor Surface Chemistry

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Thin layers of stibnite (Sb2S3) crystals have been analyzed by Fourier-Transform Infrared Spectroscopy (FT-IR). Following this analysis, the surface of the metal was changed by etching the stibnite with various organic compounds. The resulting surface was analyzed with FT-IR again, and compared against the original spectrum. Additionally, the surface was analyzed by X-Ray Photoelectron Spectroscopy (XPS) in order to verify the quality of the stibnite surface and quantify the degree of surface oxidation.

  • This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.
Creator
Publisher
Identifier
  • E-project-043015-134811
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Year
  • 2015
Date created
  • 2015-04-30
Resource type
Major
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Last modified
  • 2020-11-27

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