Faculty Advisor

Burnham, Nancy A.

Abstract

To improve the measurement of nanoscale friction, a new alternate method of lateral calibration for the atomic force microscope was examined. This method, which offers the advantage of reduced tip wear, was reviewed and analyzed, and fundamental flaws were identified in its derivation. After modifying this approach, we attempted to confirm our corrected model with a commonly accepted calibration method. The collected data displayed as yet unexplained oscillatory behavior, which showed strong correlations between lateral, drive, and error signals.

Publisher

Worcester Polytechnic Institute

Date Accepted

April 2007

Major

Physics

Project Type

Major Qualifying Project

Accessibility

Unrestricted

Advisor Department

Physics

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