Faculty Advisor

Burnham, Nancy A.

Abstract

An atomic force microscope can acquire both topographic and materials-related data, but with cantilevers of different stiffnesses. Unfortunately, changing cantilevers causes the cantilever tip's position over the sample to be lost. By oscillating a single cantilever at an overtone, however, it may be possible to emulate a cantilever of higher stiffness. Using an AFM simulator, I.C. Adams, tests were performed to determine the veracity of this theory. These tests demonstrated that the method has merit, but further experimentation is necessary.

Publisher

Worcester Polytechnic Institute

Date Accepted

January 2005

Major

Computer Science

Project Type

Major Qualifying Project

Accessibility

Restricted-WPI community only

Advisor Department

Physics

Advisor Program

Physics

Share

COinS