Faculty Advisor

Burnham, Nancy A.

Abstract

Using a 2.7 kHz laterally vibrating straight silicon AFM tip (manufactures force constant .03 N/m) in contact mode, images were produced that correspond to the LFM amplitude of the tip while scanning over the surface of MWNT on a HOPG substrate. On the surface of the MWNT the LFM amplitude was 1 volt lower than when on HOPG, characterizing a shearing behavior. The caps of the nanotube show a stiffer response than the tubular portions of the MWNT.

Publisher

Worcester Polytechnic Institute

Date Accepted

January 2002

Major

Physics

Project Type

Major Qualifying Project

Accessibility

Restricted-WPI community only

Advisor Department

Physics

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